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Effet de la rugosité de la surface des cathodes à émission de champ sur leurs caractéristiques d'émissionBONDARENKO, B. V; MAKUKHA, V. I; RYBAKOV, YU. L et al.Radiotehnika i èlektronika. 1987, Vol 32, Num 12, pp 2606-2610, issn 0033-8494Article

Calculations of enhanced field electron emission at the triple junctionCHUNG, Moon S; CHOI, Tae S; CUTLER, Paul H et al.International Vacuum Nanoelectronics Conference. 2004, pp 182-183, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Electron emission from boron nitride films deposited on patterned substratesSHIMA, Hidekazu; FUNAKAWA, Shingo; KIMURA, Chiharu et al.International Vacuum Nanoelectronics Conference. 2004, pp 268-269, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Spectrométrie d'émission électronique de champ des couches de BaO ayant diverses structuresTUMAREVA, T. A; IVANOV, V. A; KIRSANOVA, T. S et al.Fizika tverdogo tela. 1989, Vol 31, Num 2, pp 12-18, issn 0367-3294Article

Ultrahigh-vacuum field emitter array wafer testerGRAY, H. F; ARDIS, L; CAMPISI, G. J et al.Review of scientific instruments. 1987, Vol 58, Num 2, pp 301-304, issn 0034-6748Article

Effect of conductive filaments on the electron emission properties in cathodesPOA, C. H. P; SILVA, S. R. P.International Vacuum Nanoelectronics Conference. 2004, pp 76-77, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Electron field emission property of boron doping nano-crystalline diamondLEE, Y. C; LIN, S. J; HUANG, J. H et al.International Vacuum Nanoelectronics Conference. 2004, pp 126-127, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Field electron emission from ultra-high density Si nanotip arraysZHAO, K; SHE, J. C; JUN ZHOU et al.International Vacuum Nanoelectronics Conference. 2004, pp 274-275, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Characterization of an advanced heed (high efficiency electron-emission device)NEGISHI, N; NAKADA, T; SAKEMURA, K et al.International Vacuum Nanoelectronics Conference. 2004, pp 284-285, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Emission-imaging electron-optical system designIL'IN, V. P; KATESHOV, V. A; KULIKOV, YU. V et al.Advances in electronics and electron physics. 1990, Vol 78, pp 155-278, issn 0065-2539, 124 p.Article

Optimization of electron field emission from carbon nanotube pasteKIM, Yong C; SOHN, K. H; CHO, Y. M et al.International Vacuum Nanoelectronics Conference. 2004, pp 250-251, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

A new method to measure and increase the detection efficiency of a microchannel plate for 100 keV electronsTORNOW, R. P.Measurement science & technology (Print). 1990, Vol 1, Num 7, pp 576-580, issn 0957-0233Article

Optimization design for the electron emission system using Improved Powell MethodCHANG-XIN GU; LI-YING SHAN; ZHI-RONG CHEN et al.Scanning microscopy. 1991, Vol 5, Num 4, pp 937-944, issn 0891-7035Conference Paper

Electron emission stabiliser with double negative feedback loopHALAS, S; SIKORA, J.Measurement science & technology (Print). 1990, Vol 1, Num 9, pp 980-982, issn 0957-0233Article

Excitation of target Auger-electron emission by the impact of highly charged ions : N6+, O7+, and Ne9+ on Pt(110)SCHIPPERS, S; HUSTEDT, S; HEILAND, W et al.Physical review. A. 1992, Vol 46, Num 7, pp 4003-4011, issn 1050-2947Article

Multielectron spectroscopy : The xenon 4d hole double auger decayPENENT, F; PALAUDOUX, J; LABLANQUIE, P et al.Physical review letters. 2005, Vol 95, Num 8, issn 0031-9007, 083002-1-083002-4Article

Fine structure of the low-energy secondary electron emission spectra of platinum single crystalPANCHENCKO, O; PANCHENKO, L. K.Journal of communications technology & electronics. 1994, Vol 39, Num 3, pp 82-87, issn 1064-2269Article

Secondary emission formulasVAUGHAN, R.I.E.E.E. transactions on electron devices. 1993, Vol 40, Num 4, issn 0018-9383, p. 830Article

Electronic structure of metallic alloys through Auger electron spectroscopyKLEIMAN, G. G.Journal of physics. Condensed matter (Print). 1993, Vol 5, Num 33A, pp A167-A168, issn 0953-8984, SUPConference Paper

Field electron emission through and from two-dimensional electron gasFILIP, V; NICOLAESCU, D; WONG, H et al.International Vacuum Nanoelectronics Conference. 2004, pp 110-111, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Capture and emission of electrons in quantum wells under applied electric fieldVINTER, B; LUC, F; BOIS, P et al.Solid-state electronics. 1994, Vol 37, Num 4-6, pp 773-777, issn 0038-1101Conference Paper

Nonadiabatic surface reaction : mechanism of electron emission in the Cs+O2 systemBÖTTCHER, A; IMBECK, R; MORGANTE, A et al.Physical review letters. 1990, Vol 65, Num 16, pp 2035-2037, issn 0031-9007Article

Energieverteilung der Feldemission-Elektronen aus glasartigem Kohlenstoff = Energy distribution of the field emission electrons from glass type carbonSCHWAB, U.Optik (Stuttgart). 1989, Vol 81, Num 3, pp 109-112, issn 0030-4026, 4 p.Article

Os-coated cathode for very high emission-density applicationsSHIH, A; BERRY, A; MARRIAN, C. R. K et al.I.E.E.E. transactions on electron devices. 1987, Vol 34, Num 5, pp 1193-1200, issn 0018-9383Article

Interrelation de deux approches différentes dans la description de l'émission secondaire des monocristauxKORABIEV, V. V; KUDINOV, YU. A.Fizika tverdogo tela. 1987, Vol 29, Num 5, pp 1602-1604, issn 0367-3294Article

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